MRC Etch Recipes
The following information is provided to SNF users to aid in the determination of appropriate etch parameters for their etching needs when using the MRC etcher. Standard or typical recipes and results are given. Several recipes for the same material may be given. The user may want to tailor the recipes to fit their specific process. Etch rates and selectivities are given as a starting point only and should not be considered to be current. It is highly recommended that users establish the etch rates for their work by the use of test wafers as close in material and masking pattern as possible to the device wafers to be etched.
Oxide
Note: Labmembers wishing to obtain high ion bombardment should remove the quartz plate from the electrode in the chamber. It is there to prevent sputtering of the electrode material onto the sample, but will act to de-energize the ion bombardment.
|
Material Etched |
SiO2 |
SiO2 |
SiO2 |
SiO2 |
|
Gas Flow |
O2 2 sccm |
O2 2 sccm |
O2 3 sccm |
O2 4 sccm |
|
Gas Flow |
F23 15 sccm |
F23 15 sccm |
CHF3 15 sccm |
CHF3 7.5 sccm |
|
Pressure |
50 mT |
59 mT |
50 mT |
50 mT |
|
RF Forward Vpeak |
100 W 500 V |
240 W
|
50 W
|
50 W 400 V |
|
Etch Rate |
~200A/min |
~130A/min |
~600A/min |
|
|
Comments |
|
Material |
SiO2 |
LTO |
LTO |
|
Gas Flow |
O2 3 sccm |
O2 15 sccm |
O2 15sccm |
|
Gas Flow |
CHF3 15 sccm |
CHF3 3 sccm |
F23 5 sccm |
|
Pressure |
48 mT |
35 mT |
35 mT |
|
RF Forward Vpeak |
60 W 400 V |
80 W 460 V
|
80 W 500 V
|
|
Etch Rate |
~230A/min |
~152A/min |
|
|
Comments |
Nitride
|
Material Etched |
Nitride |
Nitride |
Nitride |
Nitride/Oxide |
|
Gas Flow |
O2 15 sccm |
O2 2 sccm |
O2 3 sccm |
SF6 25 sccm |
|
Gas Flow |
F23 15 sccm |
SF6 18 sccm |
CHF3 15 sccm |
F115 25 sccm |
|
Pressure |
25 mT |
53 mT |
50 mT |
50 mT |
|
RF Forward Vpeak |
50 W 340 V |
50 W 600 V
|
50 W
|
60 W
|
|
Etch Rate |
~305A/min |
~130A/min |
~600A/min |
~400A/min |
|
Comments |
LS Nitride 550A/min |
|
Material Etched |
LS Nitride |
|
Gas Flow |
O2 3 sccm |
|
Gas Flow |
F23 15 sccm |
|
Pressure |
50 mT |
|
RF Forward Vpeak |
60 W 330/400 V |
|
Etch Rate |
<1000A/min |
|
Comments |
Photoresist
|
Material Etched |
Resist |
Resist |
Resist |
Resist on GaAs |
|
Gas Flow |
O2 20 sccm |
O2 20 sccm |
O2 15 sccm |
O2 20 sccm |
|
Gas Flow |
||||
|
Pressure |
100 mT |
25 mT |
3 mT |
150 mT |
|
RF Forward Vpeak |
50 W 230 V |
55 W 340 V
|
150 W 750 V
|
60 W
|
|
Etch Rate |
~400A/min |
~1300A/min |
||
|
Comments |
|
Material Etched |
Resist |
|
Gas Flow |
O2 25 sccm |
|
Gas Flow |
|
|
Pressure |
100 mT |
|
RF Forward Vpeak |
40 W
|
|
Etch Rate |
|
|
Comments |
Polyimide
|
Material Etched |
Polyimide on Si |
Polyimide |
Polyimide/PMGI |
PMGI |
|
Gas Flow |
O2 20 sccm |
O2 20 sccm |
O2 15 sccm |
O2 20 sccm |
|
Gas Flow |
||||
|
Pressure |
100 mT |
25 mT |
3 mT |
150 mT |
|
RF Forward Vpeak |
50 W 230 V |
55 W 340 V
|
150 W 750 V
|
60 W
|
|
Etch Rate |
~400A/min |
~1300A/min |
||
|
Comments |
Silicon
|
Material Etched |
Si Etch |
Si |
SOG |
Si Carbide |
|
Gas Flow START |
SF6 5 sccm |
O2 50 sccm |
SF6 10 sccm |
O2 10 sccm |
|
Gas Flow |
F115 5 sccm |
|||
|
Pressure |
3 mT |
100 mT |
15 mT |
24 mT |
|
RF Forward Vpeak |
100 W 550 V |
200 W 700 V
|
50 W 159 V
|
200 W 880
|
|
Etch Rate |
~400A/min |
~1100A/min |
||
|
Comments |
Miscellaneous
|
Material Etched |
Oxide/Polymer |
Al on Si |
TiW Etch |
Sputter Etch |
|
Gas Flow START |
Ar 15 sccm |
Ar 15 sccm |
Ar 15 sccm |
Ar 10 sccm |
|
Gas Flow |
||||
|
Pressure |
5 mT |
4 mT |
10 mT |
10 mT |
|
RF Forward Vpeak |
150 W 750 V |
150 W 300 V
|
70 W 450 V
|
100 W 600V
|
|
Etch Rate |
~25A/min |
~1100A/min |
||
|
Comments |
|
_______________________________________________________________
Stanford Nanofabrication Facility webmaster@snf.stanford.edu Last Modified 09/02/2003 |