Gryphon/Balzers Sputterer
Summary
| Gryphon | Balzers | |
| 'Crystal' name | gryphon | balzers |
| Available targets | Al, Al/1%Si, Ti | Al, Al/1%Si, Ti,W,TiW, TiSi2, Si, boron doped Si |
| Surface etch | <200A by ion mill | <200A by RF etch |
| Substrates types accepted | 'Mainstream' Si, SiGe, quartz, sapphire. | Same as Gryphon. |
| Materials allowed | 'Mainstream' only. No fast diffusers, no magnetics, no outgassing materials. Polyimide if fully cured. No GaAs, no photoresist. Samples cannot have been processed in non-mainstream equipment. Silicides OK. | Similar to Gryphon but more special cases allowed. Please ask. |
| Cleaning required | Std prediffusion, std silicide, or double rinsed PRS-1000. Ok to come from other clean system w/o clean; ask. | Same as Gryphon. |
| Substrate shape accepted | Whole 4" wafers or under 3". Up to 1cm thick. Wafer handler cannot accept deeply etched backside surfaces. | Four inch or less. Up to 1cm thick. Deep etched OK. |
| Number of samples per run | Twelve 4" wfs/run or various samples. | Nine 4" wfs/run or 24, 3"wfs/run or combination. |
| Deposition Temp | 40-250C | 25-200C |
| Film thickness ranges | Al, Al/Si: <5um.
Ti: <1um. |
Same
Same W, TiW: <0.5um. Si: <1um. |
| Total processing time | Avg = 1hr. | Avg = 4+hrs. |
| Base pressure | To 5e -8 Torr (load lock) | To 9e -8 Torr (no load lock) |
| Options | Lock heat, dep heat, Meisner trap, ion milling. | Meisner trap, DC bias, dep heat, reactive sputtering, co-sputtering, RF etch. |
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Stanford Nanofabrication Facility Last Modified 08/29/2003 |