Mon, 06 Jun 2005 14:47:06 -0700
Greetings Raith Users:
The planned downtime to replace the RAITH 150 system SEM Column must be
delayed for two weeks.
The RAITH system will then be going offline to users 10 AM Monday June
20 through late afternoon Friday June 24.
We may possibly be seeking standby operators for test exposures evening
and overnight on Thursday June 23, 2005; but only if we can complete
raith field service test before that time. Please see James Conway if
you are interested in helping us qualify the system.
Why the delay?
RAITH GMBH and Zeiss SMT field service personnel working in Oberkocken,
DE. were forced to delay the scheduled installation of the new SEM
column on our RAITH Ebeam lithography system due to their want to fully
characterize the replacement SEM column. It was discovered during
initial testing that the Aperture Plate was aligned to the default LEO
1530 orientation and not to the standard RAITH 150 aperture orientation
which is required by the RAITH system. This forces the people working on
the system to break gun section vacuum, rotate the aperture plate, and
perform an additional bakeout on the system.
This is your notice that we will be taking the system off line from 10
AM Monday June 20 through late afternoon June 24, 2005. PCM test and
Qualification runs will be conducted that Friday afternoon 13:00 - 18:00
hours. There is the opportunity to " Share the Ride" with me during
these test.
Raith and myself apologize for the change in the planned downtime, but
this was unavoidable. Users are encouraged to make good use of this
additional time remaining to complete your work if possible on the system.
Thank you for your support!
James W. Conway
Dick Crane wrote:
> Raith users:
>
> The column replacement work scheduled for the week of June 6 has been
> delayed and is tentatively rescheduled for the week of June 20. I have
> removed the maintenance reservations from the week of June 6. Please
> feel free to sign up for this newly opened time.
>
> Thanks,
>
> Dick
Greetings Raith Users:
The planned downtime to replace the RAITH 150 system SEM Column must
be delayed for two weeks.
The RAITH system will then be going offline to users 10 AM Monday
June 20 through late afternoon Friday June 24.
We may possibly be seeking standby operators for test exposures evening
and overnight on Thursday June 23, 2005; but only if we can complete
raith field service test before that time. Please see James Conway if
you are interested in helping us qualify the system.
Why the delay?
RAITH GMBH and Zeiss SMT field service personnel working in Oberkocken,
DE. were forced to delay the scheduled installation of the new SEM
column on our RAITH Ebeam lithography system due to their want to fully
characterize the replacement SEM column. It was discovered during
initial testing that the Aperture Plate was aligned to the default LEO
1530 orientation and not to the standard RAITH 150 aperture orientation
which is required by the RAITH system. This forces the people working
on the system to break gun section vacuum, rotate the aperture plate,
and perform an additional bakeout on the system.
This is your notice that we will be taking the system off line from 10
AM Monday June 20 through late afternoon June 24, 2005. PCM test and
Qualification runs will be conducted that Friday afternoon 13:00 -
18:00 hours. There is the opportunity to " Share the Ride" with me
during these test.
Raith and myself apologize for the change in the planned downtime, but
this was unavoidable. Users are encouraged to make good use of this
additional time remaining to complete your work if possible on the
system.
Thank you for your support!
James W. Conway
Dick Crane wrote:
Raith
users:
The column replacement work scheduled for the week of June 6 has been
delayed and is tentatively rescheduled for the week of June 20. I have
removed the maintenance reservations from the week of June 6. Please
feel free to sign up for this newly opened time.
Thanks,
Dick