Subject: [Fwd: Problem raith SNF 2008-04-22 18:17:11: problem encounter by several users getting level sample holders]
From: James Conway <jwc@snf.stanford.edu>
Date: Tue, 22 Apr 2008 18:27:48 -0700
Tue, 22 Apr 2008 18:27:48 -0700
Raith Users:

Users are requested to see me during my office hour if they either 
encountered a stage to sample holder crash or any other problem during a 
load lock procedure or of they have observed missing or out of focus 
features from their EBL write results. 

Over the weekend we lost the functionality of the sample holder Faraday 
cup connection to the picoammeter and concurrently started measuring 
very large out of level conditions on both the standard and the 
universal sample holders.  The magnitude of this issue as observed is 
grossly larger than anything we have measured before and is a cause for 
grave concern.

 I am now suspecting damage to the piezo post mounting arms, or the 
ceramic mounting balls on top of the piezo stacks themselves, as a 
possible cause of this condition. This may have been a result of a user 
incorrectly mounting then attempting to load the sample holder or some 
other event affecting the mechanical integrity of the XY Stage.

Thank you,

James Conway


-------- Original Message --------
Subject: 	Problem raith SNF 2008-04-22 18:17:11: problem encounter by 
several users getting level sample holders
Date: 	Tue, 22 Apr 2008 18:17:12 -0700
From: 	jwc@snf.stanford.edu
To: 	raith-pcs@snf.stanford.edu



Caution to ALL USERS:
Both the Std. sample holder and now the Universal Sample Holder USH) are not landing
onto the piezo mounts correctly. We are measuring ~ 0.770 - 0.880 mm total delta working
distance across a 100 mm wafer -- when it should be less than 0.124 mm on the std. sample
holder and less than 2 um on the USH.
Users are requested to reply if they encountered a stage or loading sample holder crash
or misfortune during their operations over the last two weeks.  
Users writing on the system the last two weeks are requested to carefully inspect their
patterns before pattern transfer to confirm their CD's are to specifications.  Please
report to the raith@snf.stanford.edu list your observations.
Immediate field service request has been made to RAITH USA Inc. today at 6 PM PST.
Thank you,
JWC




Raith Users:

Users are requested to see me during my office hour if they either encountered a stage to sample holder crash or any other problem during a load lock procedure or of they have observed missing or out of focus features from their EBL write results. 

Over the weekend we lost the functionality of the sample holder Faraday cup connection to the picoammeter and concurrently started measuring very large out of level conditions on both the standard and the universal sample holders.  The magnitude of this issue as observed is grossly larger than anything we have measured before and is a cause for grave concern.

 I am now suspecting damage to the piezo post mounting arms, or the ceramic mounting balls on top of the piezo stacks themselves, as a possible cause of this condition. This may have been a result of a user incorrectly mounting then attempting to load the sample holder or some other event affecting the mechanical integrity of the XY Stage.

Thank you,

James Conway


-------- Original Message --------
Subject: Problem raith SNF 2008-04-22 18:17:11: problem encounter by several users getting level sample holders
Date: Tue, 22 Apr 2008 18:17:12 -0700
From: jwc@snf.stanford.edu
To: raith-pcs@snf.stanford.edu


Caution to ALL USERS:
Both the Std. sample holder and now the Universal Sample Holder USH) are not landing onto the piezo mounts correctly. We are measuring ~ 0.770 - 0.880 mm total delta working distance across a 100 mm wafer -- when it should be less than 0.124 mm on the std. sample holder and less than 2 um on the USH.
Users are requested to reply if they encountered a stage or loading sample holder crash or misfortune during their operations over the last two weeks.  
Users writing on the system the last two weeks are requested to carefully inspect their patterns before pattern transfer to confirm their CD's are to specifications.  Please report to the raith@snf.stanford.edu list your observations.
Immediate field service request has been made to RAITH USA Inc. today at 6 PM PST.
Thank you,
JWC