Subject: Fwd: AW: Sample stub height
From: ToeCutter <toecutter4ranger@gmail.com>
Date: Thu, 26 Apr 2012 10:26:47 -0700
Thu, 26 Apr 2012 10:26:47 -0700
Cole Loomis stated 10 mm max sample height with warning to carefully  
focus and update W before approaching sample carefully to avoid  
touching objective lens on SEM.

 From Germany the Raith people there stated:
> maximum allowable sample height above USH is 16mm.
>
>
>

Please be cautious using the system with larger and thicker samples

James

Begin forwarded message:

> From: "Kliem, Toralf" <kliem@raith.de>
> Date: April 26, 2012 2:57:47 AM PDT
> To: "Lev Markov" <lm@raithusa.com>, "Malchus, Heiner" <malchus@raith.de 
> >
> Cc: "Piaszenski, Guido" <piaszenski@raith.de>, "James W. Conway" <jwc@snf.stanford.edu

> >, "ToeCutter" <toecutter4ranger@gmail.com>
> Subject: AW: Sample stub height
>

> Hi Lev,
>
>
>
> maximum allowable sample height above USH is 16mm.
>
>
>
> Mit freundlichen Grüßen, Best regards
>
> i.V. Toralf Kliem
>
>
>
>
> --- 
> --------------------------------------------------------------------
> Raith GmbH
> Toralf Kliem
> Team Manager - Konstruktion / Mechanical Design
>
> email: kliem@raith.de
> phone: +49 (231) 95004 361
> fax: +49 (231) 95004 460
> web: www.raith.com
>
> --- 
> --------------------------------------------------------------------
> Raith GmbH - Konrad-Adenauer-Allee 8 - 44263 Dortmund -  
> Deutschland / Germany
> Geschaeftsfuehrer / managing director: Dr. Ralf Jede //  
> Handelsregister / trade register: Dortmund HRB 8984
> Steuer-Nr. / tax number: 315/5765/0135 // Ust.-IdNr. / VAT number:  
> DE 124 727 617
> Von: Lev Markov [mailto:lm@raithusa.com]
> Gesendet: Donnerstag, 26. April 2012 11:57
> An: Malchus, Heiner
> Cc: Kliem, Toralf; Piaszenski, Guido; James W. Conway; ToeCutter
> Betreff: Sample stub height
>
>
>
> Guys, I have a question from James Conway @ Stanford. He is trying  
> to figure out what the limit is on sample height for his RAITH150.  
> The sample in question is a 45deg mounting stub.
>
> Thanks!
>
>
>
> Lev Markov
>
>
>
> Service Engineer
>
>
>
> Raith USA, Inc.
>
> 2805 Veterans Highway, Suite 23
>
> Ronkonkoma, NY 11779
>
>
>
> www.raithusa.com
>
>
>
> Direct Line: (510) 922 8272
>
> Main Office: (631) 738 9500
>
> e-mail:     lm@raithusa.com
>
>                          
>
> This message is intended for a particular addressee only and may  
> contain business or company secrets. If you have received this email  
> in error, please contact the sender and delete the message  
> immediately. Any use of this email, including saving, publishing,  
> copying, replication or forwarding of the message or the contents is  
> not permitted.
>
>


Cole Loomis stated 10 mm max sample height with warning to carefully focus and update W before approaching sample carefully to avoid touching objective lens on SEM.

From Germany the Raith people there stated: 

maximum allowable sample height above USH is 16mm.

 


Please be cautious using the system with larger and thicker samples

James

Begin forwarded message:

From: "Kliem, Toralf" <kliem@raith.de>
Date: April 26, 2012 2:57:47 AM PDT
To: "Lev Markov" <lm@raithusa.com>, "Malchus, Heiner" <malchus@raith.de>
Cc: "Piaszenski, Guido" <piaszenski@raith.de>, "James W. Conway" <jwc@snf.stanford.edu>, "ToeCutter" <toecutter4ranger@gmail.com>
Subject: AW: Sample stub height

Hi Lev,

 

maximum allowable sample height above USH is 16mm.

 

Mit freundlichen Grüßen, Best regards

i.V. Toralf Kliem

 


-----------------------------------------------------------------------
Raith GmbH
Toralf Kliem
Team Manager - Konstruktion / Mechanical Design

email: kliem@raith.de
phone: +49 (231) 95004 361
fax: +49 (231) 95004 460
web: www.raith.com

-----------------------------------------------------------------------
Raith GmbH - Konrad-Adenauer-Allee 8 - 44263 Dortmund - Deutschland / Germany
Geschaeftsfuehrer / managing director: Dr. Ralf Jede // Handelsregister / trade register: Dortmund HRB 8984
Steuer-Nr. / tax number: 315/5765/0135 // Ust.-IdNr. / VAT number: DE 124 727 617

Von: Lev Markov [mailto:lm@raithusa.com]
Gesendet: Donnerstag, 26. April 2012 11:57
An: Malchus, Heiner
Cc: Kliem, Toralf; Piaszenski, Guido; James W. Conway; ToeCutter
Betreff: Sample stub height

 

Guys, I have a question from James Conway @ Stanford. He is trying to figure out what the limit is on sample height for his RAITH150. The sample in question is a 45deg mounting stub.

Thanks!

 

Lev Markov

 

Service Engineer

 

Raith USA, Inc.

2805 Veterans Highway, Suite 23

Ronkonkoma, NY 11779

 

www.raithusa.com

 

Direct Line: (510) 922 8272

Main Office: (631) 738 9500

e-mail:     lm@raithusa.com 

This message is intended for a particular addressee only and may contain business or company secrets. If you have received this email in error, please contact the sender and delete the message immediately. Any use of this email, including saving, publishing, copying, replication or forwarding of the message or the contents is not permitted.