Subject: Re: Problem raith SNF 2005-08-11 17:48:50: ALERT for Users working in overlay
From: jwc@snf.stanford.edu
Date: Wed, 17 Aug 2005 17:01:19 -0700

tested the system for overlay on 100 um fields and two pattern types and overlay seems
to procede without problems with target acquisition. Will report additional on High
power Visual Inspection (HPV)
James Conway 08172005: 17:01:00.00