Subject: Comment raith SNF 2006-01-20 16:18:10: ALL USERS PLEASE INSPECT THEIR WRITES!!!
From: jwc@snf.stanford.edu
Date: Fri, 20 Jan 2006 16:18:11 -0800

ALL USERS should carefully inspect their EBL patterns written in the New Year. This
week I received two reports of possible blanker leakage issues exhibited as over exposed
areas in patterns that were spaced together.  Photonic crystals.
IN writes performed during training we have observed several instances of butting errors
in stitching of patterns.
Please report to raith@snf.stanford.edu all issues your inspections yield. You do inspect
your patterns -- don't You?!!
James Conway 01202006:16:17