Subject: Shutdown raith SNF 2006-12-08 11:17:26: E/O card or image acquisition on LEO faulty
From: jwc@snf.stanford.edu
Date: Fri, 8 Dec 2006 11:17:27 -0800

Loss of SEM Scanning functions consistent with a EHT arcing event.  This may have occurred
during the sample loading when the Std. Sample holder crashed, and possibly touched
the final objective lens pole piece.
sheer terror...
JWC