From lnjiang at stanford.edu Tue Jun 13 14:35:43 2000 From: lnjiang at stanford.edu (Linan Jiang) Date: Tue, 13 Jun 2000 14:35:43 -0700 (PDT) Subject: training Message-ID: Dear Elaheh, I am studying the Si surface roughness after DRIE etching. I need to use AFM to measure the surface roughness. I would like to get training on that and please arrange time for the training at your earliest convinience. Many thanks, Linan Jiang Mech. Eng. Dept. Stanford =================