From edmyers at stanford.edu Wed Sep 8 08:22:41 2004 From: edmyers at stanford.edu (Ed Myers) Date: Wed, 08 Sep 2004 08:22:41 -0700 Subject: Pacific Nanotechnology AFM Demo at SNF Message-ID: <6.0.1.1.2.20040908081815.01b205c0@edmyers.pobox.stanford.edu> C:/DOCUME~1/EDMYER~1/LOCALS~1/Temp/msoclip1/01/clip_image002.jp Atomic Force Microscope Pacific Nanotechnology is sponsoring an all day forum with hands on demonstration on our Nano R. Wednesday Sept. 15th 2004 from 10-4 PM. Stanford University Nanofabrication Facility CIS Building Stanford, Ca 94305 in Room CIS101 Agenda Applications of the Atomic Force Microscope to Nanotechnology---10:00-10:20am Introduction to Pacific Nanotechnology, Inc. Products---- 10:20-10:40am Live Instrument Demonstration of the Nano-R? Atomic Force Microscope--Please bring your sample-10:45-4:00pm Lunch will served. If you are interested in attending this seminar, please RSVP to Ed Myers at 1-650-725-4702 or email Ed Myers at edmyers at stanford.edu Please confirm with Ed Myers if you would like to bring a sample. Depending on time, all samples may not get imaged. Note: If you do not wish to receive PNI newsletters, please email us at info at pacificnanotech.com with unsubscribe in the subject line. Nano-R? Atomic Force Microscope The Nano-R? is a general purpose atomic force microscope (AFM) for making routine images on structures with nanometer sized features. Because the Nano-R? can be used with two versions of image acquisition software, X'Pert? software and EZMode?, it is optimized for novices, casual users, and routine users. Further, the Nano-R? is supplied with the most commonly used AFM modes including contact, lateral force, material sensing, non-contact and close contact mode. The three primary subsystems of the Nano-R? AFM are the master computer, a control unit, and the Nano-R? stage. C:/DOCUME~1/EDMYER~1/LOCALS~1/Temp/msoclip1/01/clip_image003.jp Nano-R? Atomic Force Microscope Enlarged The Pacific Nanotechnology Nano-R? AFM sets a new standard in atomic force microscopy for nanotechnology, nanoscience and nanoinspection applications. It is designed to make the highest quality images and measurements of materials and structures with nanometer scale dimensions. The Nano-R? is ideal for both independent researchers and for research teams that want to share an AFM. -------------- next part -------------- A non-text attachment was scrubbed... Name: C:/DOCUME~1/EDMYER~1/LOCALS~1/Temp/msoclip1/01/clip_image002.jpg Type: image/jpeg Size: 6240 bytes Desc: not available URL: -------------- next part -------------- A non-text attachment was scrubbed... Name: C:/DOCUME~1/EDMYER~1/LOCALS~1/Temp/msoclip1/01/clip_image003.jpg Type: image/jpeg Size: 12500 bytes Desc: not available URL: From edmyers at stanford.edu Mon Sep 13 12:56:18 2004 From: edmyers at stanford.edu (Ed Myers) Date: Mon, 13 Sep 2004 12:56:18 -0700 Subject: PNI AFM Demo, Wed. Sept. 15 Message-ID: <6.0.1.1.2.20040913125003.01b8cdd8@edmyers.pobox.stanford.edu> C:/DOCUME~1/EDMYER~1/LOCALS~1/Temp/msoclip1/01/clip_image002.jp Atomic Force Microscope Pacific Nanotechnology is sponsoring an all day forum with hands on demonstration on our Nano R. Wednesday Sept. 15th 2004 from 10-4 PM. Stanford University Nanofabrication Facility Room CIS101, CIS Building Stanford, Ca 94305 Room to be announced Agenda Applications of the Atomic Force Microscope to Nanotechnology---10:00-10:20am Introduction to Pacific Nanotechnology, Inc. Products---- 10:20-10:40am Live Instrument Demonstration of the Nano-R? Atomic Force Microscope--Please bring your sample-10:45-4:00pm CIS Extension, Room 127X Library Lunch will served. If you are interested in attending this seminar, please RSVP to Ed Myers at 1-650-725-4702 or email Ed Myers at edmyers at stanford.edu Please confirm with Ed Myers if you would like to bring a sample. Depending on time, all samples may not get imaged. Note: If you do not wish to receive PNI newsletters, please email us at info at pacificnanotech.com with unsubscribe in the subject line. Nano-R? Atomic Force Microscope The Nano-R? is a general purpose atomic force microscope (AFM) for making routine images on structures with nanometer sized features. Because the Nano-R? can be used with two versions of image acquisition software, X'Pert? software and EZMode?, it is optimized for novices, casual users, and routine users. Further, the Nano-R? is supplied with the most commonly used AFM modes including contact, lateral force, material sensing, non-contact and close contact mode. The three primary subsystems of the Nano-R? AFM are the master computer, a control unit, and the Nano-R? stage. C:/DOCUME~1/EDMYER~1/LOCALS~1/Temp/msoclip1/01/clip_image003.jp Nano-R? Atomic Force Microscope Enlarged The Pacific Nanotechnology Nano-R? AFM sets a new standard in atomic force microscopy for nanotechnology, nanoscience and nanoinspection applications. It is designed to make the highest quality images and measurements of materials and structures with nanometer scale dimensions. The Nano-R? is ideal for both independent researchers and for research teams that want to share an AFM. -------------- next part -------------- A non-text attachment was scrubbed... Name: C:/DOCUME~1/EDMYER~1/LOCALS~1/Temp/msoclip1/01/clip_image002.jpg Type: image/jpeg Size: 6240 bytes Desc: not available URL: -------------- next part -------------- A non-text attachment was scrubbed... Name: C:/DOCUME~1/EDMYER~1/LOCALS~1/Temp/msoclip1/01/clip_image003.jpg Type: image/jpeg Size: 12500 bytes Desc: not available URL: