From gyama at snf.stanford.edu  Fri Jun  3 15:08:28 2005
From: gyama at snf.stanford.edu (Gary Yama (SNF))
Date: Fri, 03 Jun 2005 15:08:28 -0700
Subject: dynamic displacement
Message-ID: <42A0D4DC.20405@snf.stanford.edu>

Has anyone used the AFM to measure a dynamic displacement?

I am trying to actuate a small 1mm x 1mm square piezoelectric stack and 
see what the out of plane displacement is.

Thanks in advance - Gary


From goksenin at stanford.edu  Fri Jun  3 15:43:30 2005
From: goksenin at stanford.edu (Goksen Yaralioglu)
Date: Fri, 03 Jun 2005 15:43:30 -0700
Subject: dynamic displacement
In-Reply-To: <42A0D4DC.20405@snf.stanford.edu>
Message-ID: <5.1.1.5.2.20050603153535.02e6b5a0@goksenin.pobox.stanford.edu>

I tried something similar. In my case the voltages were relatively high and 
the cantilever deflection disturbed probably by the electrostatic forces 
between the cantilever and the surface. The best way is to keep the 
cantilever and the surface at the same potential. I do not know if this is 
easy to do on afm2. If you can somehow machine an opening, that the stack 
can fit, on a silicon wafer (or on a flat surface) and align the top 
surface of the stack to the flat surface, then you may use zygo.
Goksen


At 03:08 PM 6/3/2005 -0700, Gary Yama (SNF) wrote:
>Has anyone used the AFM to measure a dynamic displacement?
>
>I am trying to actuate a small 1mm x 1mm square piezoelectric stack and 
>see what the out of plane displacement is.
>
>Thanks in advance - Gary

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Goksen G. Yaralioglu, PhD
Stanford University
Ginzton Lab.
Stanford CA, 94305
e-mail: goksenin at stanford.edu
off tel.: (650) 725 49 42
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