dynamic displacement

Goksen Yaralioglu goksenin at stanford.edu
Fri Jun 3 15:43:30 PDT 2005

I tried something similar. In my case the voltages were relatively high and 
the cantilever deflection disturbed probably by the electrostatic forces 
between the cantilever and the surface. The best way is to keep the 
cantilever and the surface at the same potential. I do not know if this is 
easy to do on afm2. If you can somehow machine an opening, that the stack 
can fit, on a silicon wafer (or on a flat surface) and align the top 
surface of the stack to the flat surface, then you may use zygo.

At 03:08 PM 6/3/2005 -0700, Gary Yama (SNF) wrote:
>Has anyone used the AFM to measure a dynamic displacement?
>I am trying to actuate a small 1mm x 1mm square piezoelectric stack and 
>see what the out of plane displacement is.
>Thanks in advance - Gary

Goksen G. Yaralioglu, PhD
Stanford University
Ginzton Lab.
Stanford CA, 94305
e-mail: goksenin at stanford.edu
off tel.: (650) 725 49 42

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