Veeco AFM seminar
edmyers at stanford.edu
Fri Sep 26 08:51:33 PDT 2008
Mayur Savla the Veeco Bay Area AFM Applications Engineer, will hold a
Wednesday, October 8 at 2:30 to 3:15 PM
Allen Center for Integrated Systems
CIS-X Cypress Auditorium (CISX101).
He will discuss the best practices and set-up tips for optimizing
scan parameters for surface roughness and step height measurements,
Force curve measurements, Phase imaging, Fluid imaging and Electrical
Measurements using AFM.
Registration is required if you want to win the free sample pack of
AFM tips. See the flyer for instructions.
If you have any questions, please feel free to contact me or Paul
Charell at <mailto:pcharell at veeco.com>pcharell at veeco.com.
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