Veeco AFM seminar

Ed Myers edmyers at stanford.edu
Fri Sep 26 08:51:33 PDT 2008


All,

Mayur Savla the Veeco Bay Area AFM Applications Engineer, will hold a 
seminar on:

Wednesday, October 8 at 2:30 to 3:15 PM
Allen Center for Integrated Systems
CIS-X Cypress Auditorium (CISX101).

He will discuss the best practices and set-up tips for optimizing 
scan parameters for surface roughness and step height measurements,
Force curve measurements, Phase imaging, Fluid imaging and Electrical 
Measurements using AFM.

Registration is required if you want to win the free sample pack of 
AFM tips.  See the flyer for instructions.

If you have any questions, please feel free to contact me or Paul 
Charell at <mailto:pcharell at veeco.com>pcharell at veeco.com.

Regards,
Ed 
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