From chion at snf.stanford.edu  Mon Aug 11 04:52:44 2003
From: chion at snf.stanford.edu (chion at snf.stanford.edu)
Date: Aug 11, 2003 4:52:44 PM
Subject: Problem ellipsomter 2003-08-11 16:52:43: Broken Test Sample
Message-ID: <mailman.22.1356281495.3670.ellipsomter-pcs@snf.stanford.edu>

The 1265A SiO2 test sample was found broken. 



From uli at snf.stanford.edu  Mon Aug 11 04:59:24 2003
From: uli at snf.stanford.edu (uli at snf.stanford.edu)
Date: Aug 11, 2003 4:59:24 PM
Subject: Problem ellipsomter 2003-08-11 16:52:43: Report Clear for ellipsomter
Message-ID: <mailman.23.1356281495.3670.ellipsomter-pcs@snf.stanford.edu>

that is not a problem, you can still use the wafer for measurements