Fwd: Ellipsometry Workshop - FCSE 2008
edmyers at stanford.edu
Mon May 19 09:54:01 PDT 2008
>Dear J.A. Woollam Co. Customers,
>On Wednesday, June 4th, the J.A. Woollam Co.
>will be teaching a one day workshop at the FCSE
>(Functional Coatings and Surface Engineering)
>2008 Conference in Montreal, Canada. The
>workshop will begin at 8:30am. Please see workshop details below:
>Optical Characterization and Reverse
>Engineering by Spectroscopic Ellipsometry
>Ellipsometry is used to optically characterize
>all material types: semiconductors, dielectrics,
>metals, and organics possessing various
>structures, such as multi-layers and
>nanostructured thin films. With recent advances
>in optical instrumentation, many systems now
>rely on the high accuracy of spectroscopic
>ellipsometry (SE) for the measurement of film
>thickness and optical properties from VUV to IR.
>Shorter wavelengths increase sensitivity to
>ultra-thin films, while IR data allow
>identification and quantification of chemical
>bonds, as well as accurate n and k determination.
>This one day workshop will feature the following:
>* Introduction to spectroscopic ellipsometry: basic theory
>* Standard applications: thin films and bulk materials
>* Advanced applications: anisotropy and graded refractive index
>* Alternate capabilities of SE for R&D: IR
>ellipsometry and in situ ellipsometry
>* Hands-on laboratory session using the M-2000® and IR-VASE® instruments
>You may the website: www.fcse-montreal.ca for
>all the information about the FCSE 2008 Conference.
>J. A. Woollam Co., Inc.
>645 M Street, Suite 102
>Lincoln, NE 68508
>vinlow at jawoollam.com
>Phone: (402)477-7501 x101
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