Fwd: Ellipsometry Workshop - FCSE 2008

Ed Myers edmyers at stanford.edu
Mon May 19 09:54:01 PDT 2008

>Dear J.A. Woollam Co. Customers,
>On Wednesday, June 4th, the J.A. Woollam Co. 
>will be teaching a one day workshop at the FCSE 
>(Functional Coatings and Surface Engineering) 
>2008 Conference in Montreal, Canada. The 
>workshop will begin at 8:30am. Please see workshop details below:
>“Optical Characterization and Reverse 
>Engineering by Spectroscopic Ellipsometry”
>Ellipsometry is used to optically characterize 
>all material types: semiconductors, dielectrics, 
>metals, and organics possessing various 
>structures, such as multi-layers and 
>nanostructured thin films. With recent advances 
>in optical instrumentation, many systems now 
>rely on the high accuracy of spectroscopic 
>ellipsometry (SE) for the measurement of film 
>thickness and optical properties from VUV to IR. 
>Shorter wavelengths increase sensitivity to 
>ultra-thin films, while IR data allow 
>identification and quantification of chemical 
>bonds, as well as accurate n and k determination.
>This one day workshop will feature the following:
>* Introduction to spectroscopic ellipsometry: basic theory
>* Standard applications: thin films and bulk materials
>* Advanced applications: anisotropy and graded refractive index
>* Alternate capabilities of SE for R&D: IR 
>ellipsometry and in situ ellipsometry
>* Hands-on laboratory session using the M-2000® and IR-VASE® instruments
>You may the website: www.fcse-montreal.ca for 
>all the information about the FCSE 2008 Conference.
>Best regards,
>Veronica Inlow
>Veronica Inlow
>Marketing Coordinator
>J. A. Woollam Co., Inc.
>645 M Street, Suite 102
>Lincoln, NE 68508
>vinlow at jawoollam.com
>Phone: (402)477-7501 x101
>Fax: (402)477-8214

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