Reminder: SARFUS Presentation today at 10 am

Mary Tang mtang at stanford.edu
Fri Apr 13 09:20:14 PDT 2012


Hi all --

There will be a presentation by Nanolane, a company with a new form of 
optical microscopy capable of detecting nano-objects called 
surface-enhanced ellipsometric contrast microscopy (SEEC) 
(http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-15-13-8329).

The technique's power lies in the use of contrast-enhancing substrates 
called Surf slides:http://www.nano-microscopy.com/. All sorts of 
nanomaterials can be imaged and measured by SEEC and its mesuring 
extension (quantitative SEEC), in particular 
organics:http://pubs.acs.org/doi/abs/10.1021/la202703j . On top of that, 
SEEC's high sensitivity to refractive index gradients makes it 
particularly appealing to the imaging of microscopic objects such as cells.

This non-invasive/non-destructive technique is quite complementary to 
other nanocharacterisation tools and could be used on a daily basis in 
labs to take a first look at a system prior to turning to more involved 
techniques.

This will be in the Allen 101 Conference room (not 101X) at 10 am on 
Friday, April 13.

(I saw this at the MRS and invited them to Stanford.  They have 
commercially available substrates that can be processed using most 
conventional fab methods -- and can be used to visualize nm-scale films 
and features, such as DNA, ALD films, CNT's...  Very cool.)

Mary

-- 
Mary X. Tang, Ph.D.
Stanford Nanofabrication Facility
Paul G. Allen Room 136, Mail Code 4070
Stanford, CA  94305
(650)723-9980
mtang at stanford.edu
http://snf.stanford.edu




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