From dkozak at snf.stanford.edu  Thu Jun 17 21:16:28 2010
From: dkozak at snf.stanford.edu (dkozak at snf.stanford.edu)
Date: Thu, 17 Jun 2010 21:16:28 -0700
Subject: Comment nanospec SNF 2010-06-17 21:16:27: some problems
Message-ID: <mailman.84.1356282608.4312.nanospec-pcs@snf.stanford.edu>

Hello,
trying to measure Oxide on Silicon films gives wrong data (as much as 100% difference) from the samde spot.  Strange message "sending to SECS" appears after each  measurement.