Shutdown raith SNF 2006-12-08 11:17:26: E/O card or image acquisition on LEO faulty

jwc at snf.stanford.edu jwc at snf.stanford.edu
Fri Dec 8 11:17:27 PST 2006


Loss of SEM Scanning functions consistent with a EHT arcing event.  This may have occurred during the sample loading when the Std. Sample holder crashed, and possibly touched the final objective lens pole piece.
sheer terror...
JWC




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