new Thread: My contamination dots appear as strange single pixel lines and why.

Wed May 14 19:11:10 PDT 2008

James,

I observed the drift during my SEM session today and also on Monday,  I am
attaching two images obtained a few hours ago, while focus was prefect and I
was able to see very sharp grains (these are 5-20nm Pd grains) in continuous
averaging mode speed 4~5 the image would drift during slow scan and thus
loosing sharpness. Features would drift ~10-25nm during a slow scan speed 9.

Best,

Arash

----------------------------------------------------------------------------
------

Arash Hazeghi

PhD Candidate

Stanford Center for Integrated Systems

CIS-X 300, 420 Via Palou Mall, 

Stanford, CA 94305

phone: +1-650-725-0418

web: http://www.stanford.edu/~ahazeghi

From: James Conway [mailto:jwc at snf.stanford.edu] 
Sent: Wednesday, May 14, 2008 7:02 PM
To: Andrei Faraon
Cc: Raith SNF Mailing list; sem4160 at snf.stanford.edu;
semhitachi at snf.stanford.edu
Subject: new Thread: My contamination dots appear as strange single pixel
lines and why.

Hi Andrei and RAITH Users:

Likely this effect could simply be astigmatism?

Make the imaged feature as 'round '  or circular as you can using focus,
seeking the 'center of focus' where the blur is neither vertical (focused
above the feature) nor completely horizontal. (Focused below the feature)
Now try to carefully translate the stigmation controls in X-Y and try to
create a sharper and properly stigmated SEM image.  
Then check your focus again. 
Users may have to reiterate this process several times until they obtain a
nearly perfect contamination dots.

Users are reminded that your Ebeam Lithography writing result will only be
as good as your focus, so it is worth the time and effort to ensure you are
carefully focused and properly stigmated on your sample before performing a
write field alignment and finally beginning your exposure.

Good Question and I will make it a FAQ. in the near future!

Good Evening,

James Conway

Andrei Faraon wrote: 

OK...

So why when we burn contamination dots they look like lines instead of dots?

Andrei

On Wed, May 14, 2008 at 10:48 AM, James Conway <jwc at snf.stanford.edu> wrote:

The stage is not drifting.  The image is due to cooling loop fluctuations.

Best,

JWC

Andrei Faraon wrote: 

Hi James,

I used the Raith yesterday and today and I noticed that the stage drifts
considerably during SEM-ing and while burning contamination dots (sometimes
dots come out as lines). Do you think that this current problem is
correlated to the stage drift problem?

Andrei

On Tue, May 13, 2008 at 6:29 PM, James Conway <jwc at snf.stanford.edu> wrote:

Greetings Users:

The system just came down with problems in the Laser stage virtual motor
control software or possibly a real hardware issue with the X-Y Laser stage
assemblies.  
Xinran W. could not complete his Load Lock Procedure and currently his
sample and the transfer arm are inside the system chamber.

   System is down for users overnight while I figure out the best approach
to resolve this problem. I also just email Raith USA Inc.     

So have a nice quiet evening,

James 

-------- Original Message -------- 

Subject: 

Comment raith SNF 2008-05-13 18:14:46: x y Laser stage motor issues
surfacing

Date: 

Tue, 13 May 2008 18:14:47 -0700

From: 

jwc at snf.stanford.edu

To: 

raith-pcs at snf.stanford.edu

today during my test session I encountered several x motor SW flags which
indicate a possible motion or SW control problem.
 This may or may not be related to the lost ceramic ball inside the stage
rack.  Hopefully it is sitting on the system chamber floor...

monitoring overnight ...
James

-- 
Andrei Faraon

Stanford University, Applied Physics
316 Via Pueblo Mall
Stanford, CA, 94305
Mobile: 650 714 7881
Office: 650 723 2279
www.stanford.edu/~faraon <http://www.stanford.edu/%7Efaraon>  

-- 
Andrei Faraon

Stanford University, Applied Physics
316 Via Pueblo Mall
Stanford, CA, 94305
Mobile: 650 714 7881
Office: 650 723 2279
www.stanford.edu/~faraon <http://www.stanford.edu/%7Efaraon>  

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