Comment sem4160 SNF 2005-03-23 16:04:41: Scale Factors

flannery at snf.stanford.edu flannery at snf.stanford.edu
Wed Mar 23 16:04:42 PST 2005

Previous message: Problem sem4160 SNF 2005-03-04 17:50:16: SEM4160
Next message: Problem sem4160 SNF 2005-03-30 21:50:44: imaging higher 1000X
Messages sorted by: [ date ] [ thread ] [ subject ] [ author ]

We used a repeating pattern to measure the pitch. Based on this, the SEM over measures by 0.4% in X and 0.13% in Y.

Previous message: Problem sem4160 SNF 2005-03-04 17:50:16: SEM4160
Next message: Problem sem4160 SNF 2005-03-30 21:50:44: imaging higher 1000X
Messages sorted by: [ date ] [ thread ] [ subject ] [ author ]

More information about the sem4160-pcs mailing list