Comment sem4160 SNF 2005-03-23 16:04:41: Scale Factors

flannery at snf.stanford.edu flannery at snf.stanford.edu
Wed Mar 23 16:04:42 PST 2005


We used a repeating pattern to measure the pitch. Based on this, the SEM over measures by 0.4% in X and 0.13% in Y.




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