From qyong at snf.stanford.edu Wed Jul 9 12:05:21 2008 From: qyong at snf.stanford.edu (qyong at snf.stanford.edu) Date: Wed, 9 Jul 2008 12:05:21 -0700 Subject: Problem sem4160 SNF 2008-07-09 12:05:21: poor resolution Message-ID: the image can be focused only for the middle section and the top section will be fuzzy. only when saving the image to the software,there will be horizontal lines. From jwc at snf.stanford.edu Wed Jul 9 13:30:41 2008 From: jwc at snf.stanford.edu (jwc at snf.stanford.edu) Date: Wed, 9 Jul 2008 13:30:41 -0700 Subject: Problem sem4160 SNF 2008-07-09 13:30:41: problem with aperture strip Message-ID: this morning users repotrted problems in resolution. I found that the beam monitor aperture had been closed and the aperture strip movcable aperture had been jammed at full travel. I performed a new alignment of the beam monitor aperture maximizing Beam I and finding the center. I was unable to adjust the movable aperture strip but did find the beam. It could possibly be damages or the system had become contaminated with hydrocarbons which affect the ability to perform electro magnetic lens adjustments. Requesting hitachi field service go over and check out the system and if necessary replace the moveable aperture strip with newe part and then realign all sections in the column. also during column adjust could not see any changes in the stigmation or condenser lens settings when adjusting the controls. JWC From tberg at snf.stanford.edu Tue Jul 15 10:48:11 2008 From: tberg at snf.stanford.edu (tberg at snf.stanford.edu) Date: Tue, 15 Jul 2008 10:48:11 -0700 Subject: Problem sem4160 SNF 2008-07-09 13:30:41: problem with aperture strip Message-ID: System aligned by FS looks good now From tberg at snf.stanford.edu Tue Jul 15 10:48:21 2008 From: tberg at snf.stanford.edu (tberg at snf.stanford.edu) Date: Tue, 15 Jul 2008 10:48:21 -0700 Subject: Problem sem4160 SNF 2008-07-09 12:05:21: poor resolution Message-ID: System aligned by FS looks good now From jwc at snf.stanford.edu Wed Jul 16 11:45:57 2008 From: jwc at snf.stanford.edu (jwc at snf.stanford.edu) Date: Wed, 16 Jul 2008 11:45:57 -0700 Subject: Problem sem4160 SNF 2008-07-16 11:45:53: Poor resolution and brightness Message-ID: I am observing poor resolution and brightness on the tool. Adjustments in 'column adjust' functions for the stigmation and condensor sections have little to no effect. Hitachi Field service is requested to evaluate if we need to PM the tool again. JWC From jwc at snf.stanford.edu Wed Jul 16 16:53:32 2008 From: jwc at snf.stanford.edu (jwc at snf.stanford.edu) Date: Wed, 16 Jul 2008 16:53:32 -0700 Subject: Problem sem4160 SNF 2008-07-16 11:45:53: Poor resolution and brightness Message-ID: realigned the FE GUN using the four mechanical screws and then adjusted the column alignments. Performed resolution test on Sn on Carbon stud at 300 and 100 kx magnification. Ultimate resolution is 6 nm in X and 5.4 nm in Y. Brightness improved markedly after the FE-Gun realignment. Optimized gun aperture, movable aperture No. 4 for 10 - 11 mm Working distance at 10 keV Acceleration Voltage. No other issues observed. Users are asked to NOT translate or attempt to adjust the upper movable aperture plate which is the Beam Monitor apertures, only the lower movable aperture strip should be adjusted when doing aperture alignment. Thank you for your user reports on this system. James Conway From jwc at snf.stanford.edu Wed Jul 30 13:56:38 2008 From: jwc at snf.stanford.edu (James Conway) Date: Wed, 30 Jul 2008 13:56:38 -0700 Subject: Virus on sem4160 image capture computer In-Reply-To: <2feeb6700807301352s38085f13i68af32820d632184@mail.gmail.com> References: <2feeb6700807301352s38085f13i68af32820d632184@mail.gmail.com> Message-ID: <4890D586.5090603@snf.stanford.edu> Thank you for your report! This seems odd as that this computer has never been on any network. Will take a look at this item when I have some time.... Best, JWC Nahid Harjee wrote: > James, > > I believe that there's a virus on the sem4160 image capture computer. > This morning I copied images I took last night onto a USB key. I > noticed that in addition to my images, two unwanted files (autorun.inf > and nncu6kk.com ) also appeared on the key. A > quick Google search shows that these are related to spyware. Just > thought you should know. > > nh > > -- > Nahid Harjee > Ph.D. Candidate > Electrical Engineering > Stanford University > 408-761-8651 -------------- next part -------------- An HTML attachment was scrubbed... URL: From jimkruger at yahoo.com Wed Jul 30 16:04:24 2008 From: jimkruger at yahoo.com (jim kruger) Date: Wed, 30 Jul 2008 16:04:24 -0700 (PDT) Subject: Virus on sem4160 image capture computer In-Reply-To: <4890D586.5090603@snf.stanford.edu> Message-ID: <224885.59962.qm@web38901.mail.mud.yahoo.com> I bet the "malware" came in on someone's USB key. If we had anti-virus / anti-spyware checking software on all the "public" PCs and everyone checked upon inserting their USB key, we could defeat this hazard. jim --- On Wed, 7/30/08, James Conway wrote: > From: James Conway > Subject: Re: Virus on sem4160 image capture computer > To: "Nahid Harjee" , sem4160 at snf.stanford.edu, sem4160-pcs at snf.stanford.edu > Date: Wednesday, July 30, 2008, 1:56 PM > Thank you for your report! > This seems odd as that this computer has never been on any > network. > > Will take a look at this item when I have some time.... > > Best, > > JWC > > > > Nahid Harjee wrote: > > James, > > > > I believe that there's a virus on the sem4160 > image capture computer. > > This morning I copied images I took last night onto a > USB key. I > > noticed that in addition to my images, two unwanted > files (autorun.inf > > and nncu6kk.com ) also > appeared on the key. A > > quick Google search shows that these are related to > spyware. Just > > thought you should know. > > > > nh > > > > -- > > Nahid Harjee > > Ph.D. Candidate > > Electrical Engineering > > Stanford University > > 408-761-8651