From jwc at snf.stanford.edu Fri Feb 6 12:02:43 2009 From: jwc at snf.stanford.edu (James Conway) Date: Fri, 06 Feb 2009 12:02:43 -0800 Subject: SEM Practicum class on the Hitachi sem4160 Field Emission SEM Classes for February and March 2009 Message-ID: <498C9763.9060003@snf.stanford.edu> Greetings Future SEM User: You are invited to attend my "SEM Practicum" which explores the operational aspects of Scanning Electron Microscopy on the Hitachi S-4160 system at SNF. This short class is designed to get you up and running hands-on on this instrument to assist you in imaging and measuring your structures on the micro and nano-scales. I have just scheduled four sessions on the tool that you can sign up to attend: Wednesday February 11, 2008 from 10:00 AM to 12:30 PM Wednesday February 25, 2008 from 10:00 AM to 12:30 PM Wednesday March 10, 2008 from 10:00 AM to 12:30 PM Wednesday March 25, 2008 from 10:00 AM to 12:30 PM I have attached the Standard Operations Procedure for the tool for your reference. Any questions, please see me during my office hours. Thank you for your interest in Ebeam Technologies here at Stanford Nanofabrication Facility. James Conway -------------- next part -------------- An HTML attachment was scrubbed... URL: -------------- next part -------------- A non-text attachment was scrubbed... Name: sem4160_sop_ahryciw.pdf Type: application/pdf Size: 178741 bytes Desc: not available URL: