contamination limits
Michael Deal
mdeal at stanford.edu
Mon Mar 28 10:58:37 PST 2005
Jim and I just discussed the metal contamination level issue. We suggest
the following limits from TXRF or TOF-SIMS measurements:
For "semiclean": metal contamination should be less than 1x10^12 cm-2
This is based on the agreed upon purity of some of the targets used in
the SCT sputtering system (99.95% pure)
For "clean": metal contamination should be less than 1x10^11 cm-2
This is based on past results of our cleans, etc.
-mike
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