ALD HfO2 in Prof. McIntyre's Lab

[Ed Myers]

Ching-Huang,

I looked over your request.  SpecMat has established TXRF limits for our 
Clean and SemiClean classifications.  Unfortunately, your data shows you 
slightly higher than the allowed contamination limits (1E12 
atoms/cm2).  Since one of the offenders is iron, I am reluctant to 
recommend approval of your sample.  Is there a chance the system could be 
cleaned to clear up some of the contamination?

Regards,
Ed



At 10:59 AM 10/4/2005, Ching-Huang Lu wrote:
>Dear Committee,
>
>Raghav and I  have been trying to build transistors with ALD HfO2 in Prof. 
>McIntyre's Lab.
>We would like to get this ALD film certified so that we can start the 
>processing in the semi-clean tools.
>Attached please find the TXRF data file. This TXRF data obtained on our 
>ALD HfO2 shows that the film is pretty clean.
>Please let us know if you have any question or need more information.
>
>thanks
>
>Ching-Huang
>