FW: Ge on Silicon pieces used for XPS and TOF-SIMS surface analysis

Mary Tang mtang at stanford.edu
Fri May 14 11:41:22 PDT 2010


Hi all --

Just so you know -- Grace and Oguz are from Intel.

Mary

Elibol, Oguz H wrote:
>
> Hi Nancy,
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>  
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> FYI, it looks the oxide grown in Tylan2 has some Ge contamination. 
> Please do not forward or distribute the plot. Thanks to Grace for this 
> information.
>
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> Oguz
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-- 
Mary X. Tang, Ph.D.
Stanford Nanofabrication Facility
CIS Room 136, Mail Code 4070
Stanford, CA  94305
(650)723-9980
mtang at stanford.edu
http://snf.stanford.edu

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