Comment sts SNF 2009-06-08 11:34:12: Nitride test and LF oxide test were lower

[jperez at snf.stanford.edu]

Four test wafers and average was just about the same
Front TW Avg. 928A , dep rate 91A/min.
Back TW  Avg. 923 A, dep rate 90.6 A/min.
Right TW Avg. 930A, dep rate 91A/min.
Left   TW Avg. 925A, dep rate 90.7 A/min.