Comment sts SNF 2009-06-08 11:34:12: Nitride test and LF oxide test were lower

jperez at snf.stanford.edu jperez at snf.stanford.edu
Mon Jun 29 06:42:04 PDT 2009


New test for 2% siland bottle change, Oxide test Avg. on two 
test wafers are 400 A and 395A. Test from low frequency.




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