Next STS PECVD user
Jeannie Perez
jperez at snf.stanford.edu
Wed Jan 23 15:44:41 PST 2002
Hi everyone,
For the next user depositing Silicon Nitride, please record results in
the logbook especially the refractive index.
The STS PECVD system had a SiH4 / N2 cylinder change. The way I
qualified it was by;
1. Did a clean (only because it was close to 3.0 um).
2. Ran an oxide recipe that had been ran Jan. 10th.
3. Ran two four inch wafers for 2 minutes, Refractive index 1.458.
top 849 A
middle 876 A Avg. 853 A delta 43 A
flat 833 A
Second wafer butted up to the flat of the first wafer..
flat 927
middle 943 Avg. 943 A, delta 34
A
top 961
Any questions or suggestions, please feel free to talk to me.
Jeannie Perez
723-7997
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