Comment svgcoat2 SNF 2009-04-22 09:35:30: 955-7 .7um thickness test 4/22/09

gsosa at snf.stanford.edu gsosa at snf.stanford.edu
Wed Apr 22 09:35:30 PDT 2009


Checked the 0.7 micron resist program for SPR 955-.7 photoresist.  Target thickness = 0.7 microns. Mean thickness(5 points): 6883  Angstroms, Std Dev. 11 Angstroms. Spin quality looked good. EBR looked good and backs of wafers looked clean.




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