From slcheng at snf.stanford.edu Fri Jun 4 00:11:43 2010 From: slcheng at snf.stanford.edu (slcheng at snf.stanford.edu) Date: Fri, 4 Jun 2010 00:11:43 -0700 Subject: Problem tylanfga SNF 2010-06-04 00:11:42: huge noise when tube going in. Message-ID: From tberg at snf.stanford.edu Fri Jun 4 06:37:13 2010 From: tberg at snf.stanford.edu (tberg at snf.stanford.edu) Date: Fri, 4 Jun 2010 06:37:13 -0700 Subject: Comment tylanfga SNF 2010-06-04 06:37:13: bad motor Message-ID: From seymour at snf.stanford.edu Fri Jun 4 07:38:33 2010 From: seymour at snf.stanford.edu (seymour at snf.stanford.edu) Date: Fri, 4 Jun 2010 07:38:33 -0700 Subject: Problem tylanfga SNF 2010-06-04 00:11:42: huge noise when tube going in. Message-ID: ted replaced loader mottor. checks ok From seymour at snf.stanford.edu Fri Jun 4 07:38:54 2010 From: seymour at snf.stanford.edu (seymour at snf.stanford.edu) Date: Fri, 4 Jun 2010 07:38:54 -0700 Subject: Comment tylanfga SNF 2010-06-04 06:37:13: bad motor Message-ID: motor replaced From gth at snf.stanford.edu Mon Jun 14 15:25:59 2010 From: gth at snf.stanford.edu (gth at snf.stanford.edu) Date: Mon, 14 Jun 2010 15:25:59 -0700 Subject: Problem tylanfga SNF 2010-06-14 15:25:59: dirt on the wafer. Message-ID: I loaded a Si wafer with 30nm LTO SiO2 and capped with 100nm Aluminum in the FGA tube. Wafer was unpatterned. FGA 400, 30min The wafers face was facing the back of the tube. I got the entire wafer covered with dirt on Aluminum. Either the tube is dirty or the gas lines are dirty. Please check. To reproduce the problem, I recommend loading a dummy from Gryphon the way I did. From maurice at snf.stanford.edu Wed Jun 16 15:25:55 2010 From: maurice at snf.stanford.edu (maurice at snf.stanford.edu) Date: Wed, 16 Jun 2010 15:25:55 -0700 Subject: Comment tylanfga SNF 2010-06-16 15:25:54: running FGA400 test Message-ID: Running FGA400 00:15:00 on clean oxide wafer. Will inspect for "dirt". From maurice at snf.stanford.edu Wed Jun 16 17:13:25 2010 From: maurice at snf.stanford.edu (maurice at snf.stanford.edu) Date: Wed, 16 Jun 2010 17:13:25 -0700 Subject: Comment tylanfga SNF 2010-06-16 15:25:54: running FGA400 test Message-ID: Ran 2 test. Both FGA400 00:15:00. First test was with a 1550 ang oxide wafer. Second test was a 1um Al on oxide. Both wafers were facing the source. Both wafers looked clean. From maurice at snf.stanford.edu Thu Jun 17 10:11:16 2010 From: maurice at snf.stanford.edu (maurice at snf.stanford.edu) Date: Thu, 17 Jun 2010 10:11:16 -0700 Subject: Problem tylanfga SNF 2010-06-14 15:25:59: dirt on the wafer. Message-ID: Ran 2 test. Both FGA400 00:15:00. First test was with a 1550 ang oxide wafer. Second test was a 1um Al on oxide. Both wafers were facing the source. Both wafers looked clean after anneal. Will contact user Gth to see his wafers.