From anojeh at stanford.edu Wed May 19 12:50:32 2004 From: anojeh at stanford.edu (Alireza Nojeh) Date: Wed, 19 May 2004 12:50:32 -0700 (PDT) Subject: Wafersaw: y-offset problem. Message-ID: Hi saw users, There was a big y-offset today: first during the height adjustment routine, the blade would go out of the chuck area, so I had to bring the microscope way towards the user side to compensate for that. And then I had to do a y-offset adjustment of a few centimeters after the test cuts. Just to let everyone know, Ali From mtang at snf.stanford.edu Wed May 19 13:43:11 2004 From: mtang at snf.stanford.edu (Mary Tang) Date: Wed, 19 May 2004 13:43:11 -0700 Subject: Wafersaw: y-offset problem. References: Message-ID: <40ABC6DF.73067DCA@snf.stanford.edu> Hello wafersaw users -- Mary thanks, Ali -- I'm sorry, I meant to look at this today... A couple of things. First, I'm just about to put a standard blade at the wafersaw. Second, there are a couple of users (quickwin and daneman and maybe one/two others) who are using non-standard blades, which results in a more-than-usual Y-offset (this was described in the wafersaw at snf discussion list, 2/18/04) when switching back to standard blades. But this offset is only a mm or so, and should be straightforward to correct, following standard operating procedures. If the blade is offset by several cm, then it is because the Y-offset calibration may have not been properly set. I know that the Y-offset generally does not need to be changed (since most people use the std blade hub) so is not often checked. But I would strongly recommend checking it, so you don't put your devices at risk. Does anyone not feel comfortable with the Y-offset procedure? If not, please let me know and we can go over it. Finally, for those of you who are using non-standard blades (Ben, Mike, others) -- when you are done, could you please put a standard blade on and do a Y-offset calibration? Or at the very least, make a note of it, so the next user is aware of this and doesn't inadvertently cut into their device on the test cut. Or, better yet, both. (Anyone have other suggestions?) Thanks, Mary Alireza Nojeh wrote: > Hi saw users, > > There was a big y-offset today: first during the height adjustment > routine, the blade would go out of the chuck area, so I had to bring the > microscope way towards the user side to compensate for that. And then I > had to do a y-offset adjustment of a few centimeters after the test cuts. > > Just to let everyone know, > Ali -- Mary X. Tang, Ph.D. Stanford Nanofabrication Facility CIS Room 136, Mail Code 4070 Stanford, CA 94305 (650)723-9980 mtang at stanford.edu http://snf.stanford.edu