From jperez at snf.stanford.edu Tue Mar 1 11:12:22 2011 From: jperez at snf.stanford.edu (jperez at snf.stanford.edu) Date: Tue, 1 Mar 2011 11:12:22 -0800 Subject: Problem woollam SNF 2011-03-01 11:12:20: Unable to log in. Message-ID: Computer will not show cursor to type User log in. From jperez at snf.stanford.edu Tue Mar 1 11:39:04 2011 From: jperez at snf.stanford.edu (jperez at snf.stanford.edu) Date: Tue, 1 Mar 2011 11:39:04 -0800 Subject: Problem woollam SNF 2011-03-01 11:12:20: Unable to log in. Message-ID: Reboot computer, OK to use. From jperez at snf.stanford.edu Thu Mar 24 13:53:39 2011 From: jperez at snf.stanford.edu (jperez at snf.stanford.edu) Date: Thu, 24 Mar 2011 13:53:39 -0700 Subject: Problem woollam SNF 2011-03-24 13:53:39: My index of refraction was high, 20 + Message-ID: I read test wafer on Rudolph ellipsometer and index was good (normal) 1.47 From emyers at snf.stanford.edu Fri Mar 25 10:54:16 2011 From: emyers at snf.stanford.edu (emyers at snf.stanford.edu) Date: Fri, 25 Mar 2011 10:54:16 -0700 Subject: Problem woollam SNF 2011-03-24 13:53:39: My index of refraction was high, 20 + Message-ID: I ran the model for the data and it worked OK. If the model gives a poor first measurement, it follows in all remaining sites. One problem with automated measurements calculating multiple parameters.