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AFM2, afm2

Digital Instruments AFM Nanoscope Dimension 3000: * Atomic Force and scanning tunneling scanning modes: contact, tapping, non-contact, liftmode, force modulation, lateral force microscopy, magnetic force microscopy, phase imaging, scanning capacitance, lithography, electric force micrscopy * Integrated top-view color video optics with motorized zoom and 1.5 m optical resolution * X-Y stage that provides substantially better positioning repeatability - 3m unidirectional and 4-6m bidirectional * Little or no sample preparation for increased productivity * Easily changes among all AFM/STM scanning modes/techniques without tools

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